Better Memory – Don’t we all want it?
Memory is at the core of a well functioning human or embedded system device. Without good memory, we all fail to perform.
As I traveled throughout the world, meeting customers, prospects, designers, and manufacturers, I have learned that a key first step of getting a new electronic device to market is proving that all forms of memory are working properly. Proving that DDR SDRAM memory is working on complex systems is particularly daunting and has been a common area of concern for many product designers.
Ulrich Brandt wrote an excellent article on building DRAM memory modules titled “The Art of DRAM Module Testing.” In this article he stressed the importance of testing memory multiple times, and under temperature variances.
One of the values of using Kozio’s VTOS DDR is that it provides years of DDR SDRAM application testing experience in a single application. Kozio developed proprietary algorithms that have been used to effectively test memory on millions of embedded devices. Kozio customers using our memory tests have found memory failures at high, low, and ambient temperatures.
Ulrich mentions that one cannot test 100% of memory since the test program and OS reserves memory for its own use. Kozio has addressed that issue by using other memory devices; testing DRAM memory from L2 Cache, for program execution, enables 100% DRAM testing.
Please stay tune for more information on the topic and as we report on our recent DDR configuration, tuning, and verification survey.