Category Archives: DDR Calibration and Validation

Posts related to DDR, DDR2, DDR3, and DDR4 calibration, validation, verification, and testing.

Faster DDR Test

faster_ddr_test_bannerYou may think it’s too expensive to test every every cell of DDR memory during manufacturing, but we have a solution that may change your mind. Introducing VTOS DDR Test. Read more

Posted in DDR Calibration and Validation | Leave a comment

New VTOS Tools support for NXP QorIQ T1xxx

VTOS ToolsVTOS DDR and VTOS Scan Plus were updated to support NXP QorIQ T1xxx family of processors. Use the the tools for DDR3/4 tuning and validation. Create tests and commands for working with GPIO, I2C, SPI, UART, Bluetooth, Ethernet PHY, and SD/MMC/SDIO devices. Read more

Posted in DDR Calibration and Validation, Design, Hardware Interface Testing, Repair Station Tools, Test Automation | Leave a comment

Creating Custom Tests with Kozio Scripting

VTOS ToolsWe added a new feature to make it easier to add custom tests and custom commands to your test configuration. Read more

Posted in DDR Calibration and Validation, Hardware Interface Testing, In-System Device Programming, Repair Station Tools, Test Automation | Leave a comment

Customer Story: Success Isolating Board Issues for Repair Station

kozio-customer-storyThe customer needed an easy-to-use solution that would isolate failing components on bad i.MX6 (ARM® Cortex®-A9) boards. Kozio provided and demoed a DDR validation tool and a hardware test tool that found eMMC issues. Read more

Posted in DDR Calibration and Validation, Hardware Interface Testing, Repair Station Tools | Leave a comment

Introducing JTAG Integration with VTOS Tools™

JTAG Integration with VTOS ToolsKozio offers new product integration that reduces the effort of bringing up new boards, or automating the testing of newly manufactured boards. Kozio is providing seamless integration with JTAG programmers. Read more

Posted in DDR Calibration and Validation, Design, General, Hardware Interface Testing, Storage Device Programming, Test Automation | Leave a comment

VTOS DDR™ Support for Zynq-7000 All Programmable SoC Designs

vtos-ddr-banner-1We released a new VTOS DDR™ package supporting board designs using Zynq-7000 All Programmable SoCs from Xilinx. Read more

Posted in DDR Calibration and Validation | Leave a comment

VTOS DDR™ Support for MPC85xx Power Architecture® Designs

vtos-ddr-banner-1Kozio released a new VTOS DDR™ package supporting board designs using MPC85xx processors from Freescale. VTOS DDR provides DDR calibration and validation, along with comprehensive testing of DDR memories for manufacturing test. Read more

Posted in DDR Calibration and Validation | Leave a comment

DDR Optimization and HW Testing for i.MX 6DualLite Board Designs

VTOS DDR & VTOS ScanKozio is expanding its support of the i.MX6 processor family from Freescale. Both VTOS DDR™ and VTOS Scan™ are being released with added support for the i.MX 6DualLite (i.MX6DL) with dual ARM® Cortex®-A9 cores. These products provide DDR validation and board-level testing for the entire line of i.MX6 processors. Read more

Posted in DDR Calibration and Validation, Hardware Interface Testing | Leave a comment

Customer Story: Success Finding DDR Settings across Temps

blog-banner-customer-storyKozio provided a DDR calibration and validation tool that was used to find optimal DDR settings on an ARM® Cortex®-M4 board design. The customer used VTOS DDR™ to find DDR settings that worked across all temperatures. DDR settings obtained from two other tools did not work. Read more

Posted in DDR Calibration and Validation | Leave a comment

DDR Optimization, HW Testing, and Programming for Zynq SoCs

VTOS ToolsIf you are looking for embedded tools that will save you months of effort optimizing and validating your Zynq-based design, we have just announced support. Kozio will release a DDR calibration and optimization tool, a hardware interface test tool, and a device programming tool for board designs using the Zynq All Programmable SoCs. Read more

Posted in DDR Calibration and Validation, Hardware Interface Testing, Storage Device Programming, Test Automation | Leave a comment