Version 2.0.7

Release date: 22-jul-2016

What’s New

• VTOS Scan ADC for TI Sitara AM335x. Provides improvements to ADC channel testing.
• VTOS DDR performance improvements for the march test.
• VTOS DDR improvements for the tuning on QorIQ based platforms.

VTOS Tools

• No specific changes in this release, see VTOS Tools for general product updates.

VTOS DDR

• Issue: corrected operation of the DDR march test on QorIQ platforms.
• Feature: Performance improvement for the DDR march test.   On high-performance QorIQ platforms (T1xxx, P4xxx, P5xxx) the march test now takes about 6 seconds per megabyte and 1.75 hours per gigabyte.  On value-performance QorIQ platforms (P1xxx, P2xxx), the march test takes 8 seconds per megabyte and 2.25 hours per gigabyte.
• Issue: corrected a VTOS DDR crash that occurred when running the DDR tuning.
• Feature: improved DDR tuning on QorIQ platforms to better handle boards with ECC memory.

VTOS Program

• No specific changes in this release, see VTOS Tools for general product updates.

VTOS Scan

• Issue: Driver updates for VTOS Scan ADC and new commands.
  • [device] [channel] ADC.RAW – Returns raw digital value from the ADC Channel. Add “.dec” after ADC.RAW to display value read in decimal format.
  • [device] [channel] ADC.CONVERT – Returns a converted value in microvolts from the ADC Channel. Add “.dec” after ADC.CONVERT to display value read in decimal format.
  • [device] ADC.DUMP – Reads a single value from all available channels and prints that value in raw digital format and microvolts.
  • [device] [channel] [count] ADC.SAMPLE – Reads [count] values from the selected channel and prints the value reads in raw digital format and microvolts.

vAccess

• No specific changes in this release, see VTOS Tools for general product updates.